SiCf-SiBC composites: Microstructural investigations of the as-received material and creep tested composites under an oxidative environment

Journal of Microscopy

Volumn 210, Issue 2, 2003, Pages 176-186

  Farizy, G ^a   Chermant, J L ^a   Sangleboeuf, J C ^b   Vicens, J ^a  

^a LERMAT Laboratoire d'Etude et de Recherche sur les Materiaux   (France)

^b IRISA Campus   (France)

Author keywords

EDX; Interfaces; Multilayered matrix; SiCf SiBC; Transmission electron microscopy

Indexed keywords

CREEP; FIBERS; GLASS; SILICA;

MATRIX LAYERS; MICROSTRUCTURAL INVESTIGATION; MULTILAYERED MATRIX; NIPPON CARBON; OXIDATIVE ENVIRONMENT; PYROCARBONS; SICF-SIBC; SNECMA PROPULSION SOLIDE; TEMPERATURE RANGE;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

BORON; CARBON; GLASS; SEALANT; SILICON; SILICON DIOXIDE;

AIR; ARTICLE; CERAMICS; COMPOSITE MATERIAL; CRYSTAL STRUCTURE; CRYSTALLIZATION; ELECTRON MICROSCOPY; FIBER; HEATING; OXIDATION; PRIORITY JOURNAL; STRUCTURE ANALYSIS; TEMPERATURE; CHEMISTRY; ENVIRONMENT; HEAT; OXIDATION REDUCTION REACTION; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY;

AIR; CERAMICS; ENVIRONMENT; GLASS; HEAT; MICROSCOPY, ELECTRON; MICROSCOPY, ELECTRON, SCANNING; OXIDATION-REDUCTION; SILICON DIOXIDE; SURFACE PROPERTIES;

EID: 0037687520     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2003.01128.x     Document Type: Article

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