Heisenberg principle applied to the analysis of speckle interferometry fringes

Optics and Lasers in Engineering

Volumn 40, Issue 5-6, 2003, Pages 573-588

  Sciammarella, C A ^a   Sciammarella, F M ^a  

^a Illinois Institute of Technology   (United States)

Author keywords

Fringe pattern analysis; Heisenberg uncertainty principle; Whittaker Shannon theorem; Window Fourier transform

Indexed keywords

FOURIER TRANSFORMS; SPECKLE; THEOREM PROVING;

FRINGE PATTERN ANALYSIS;

INTERFEROMETRY;

EID: 0037672618     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(02)00078-7     Document Type: Article

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