Microstructural effects of recording marks on erasing in AgInSbTe phase-change optical disk

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 42, Issue 1 A/B, 2003, Pages

  Chang, Yem Yeu ^a   Chou, Lih Hsin ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

AgInSbTe; CD linear velocities; CD RW; Grain growth; Microstructures of amorphous marks; Nucleation; Phase change

Indexed keywords

GRAIN GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; NUCLEATION; OPTICAL RECORDING; SILVER ALLOYS;

MICROSTRUCTURAL EFFECTS; PHASE CHANGE;

CD-ROM;

EID: 0037667853     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.l70     Document Type: Letter

References (10)

1. H. Iwasaki, M. Harigaya, O. Nonoyama, Y. Kageyama, M. Takahashi, K. Yamada, H. Deguchi and Y. Ide. Jpn. J. Appl. Phys. 32 (1993) 5241.
2. Y. Kageyama, H. Iwasaki, M. Harigaya and Y. Ide. Jpn. J. Appl. Phys. 35 (1996) 500.
3. M. Shinotsuka, T. Shibaguchi, M. Abe and Y. Ide: Jpn. J. Appl. Phys. 36 (1997) 536.
4. E. Muramatsu, A. Yamaguchi, K. Horikawa, M. Kato, S. Taniguchi, S. Jinno, M. Yamaguchi, H. Kudo and A. Inoue. Jpn. J. Appl. Phys. 37 (1998) 2257.
5. T. Kikukawa and H. Utsunomiya: Microsc. & Microanal. 7 (2001) 363.
6. Y. Y. Chang and L. H. Chou: Jpn. J. Appl. Phys. 39 (2000) L294.
7. Y. Y. Chang, L. H. Chou and H. T. Lin: submitted to Nanotechnology.
8. Y. Nichi, H. Kando and M. Terao: Jpn. J. Appl. Phys. 41 (2002) 631.
9. R. Zhao, K. Lim, Z. Li, J. Liu, J. Ho, T. Chong, Z. Liu, B. X. Xu and L. Shi: Jpn. J. Appl. Phys. 39 (2000) 3458.
10. G. F. Zhou, H. J. Borg, J. C. N. Rijpers and M. Lankhorst: Tech. Dig. Optical Data Storage (2000) p. 74.