X-ray spectroscopy and ion extraction at the Dresden EBIT

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 205, Issue , 2003, Pages 260-265

  Kentsch, U ^a   Landgraf, S ^a   Schmidt, M ^a   Zschornack, G ^a   Grossmann, F ^b   Ovsyannikov, V P ^b   Ullmann, F ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b Leybold Vakuum Dresden GmbH   (Germany)

Author keywords

EBIT; Highly charged ions; Ion source; Ion trap; X ray spectroscopy

Indexed keywords

ELECTRON BEAMS; ION SOURCES; X RAY SPECTROSCOPY; XENON;

ION EXTRACTION;

ELECTRON TRAPS;

EID: 0037656473     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)00554-8     Document Type: Conference Paper

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