The effect of structure and chemistry on the strength of FeCrAl(Y)/sapphire interfaces: I. Structure and chemistry of interfaces

Materials Science and Engineering: A

Volumn 349, Issue 1-2, 2003, Pages 248-255

  Basu, S N ^a   Wu, H ^a   Gupta, V ^b   Kireev, V ^b  

^a BOSTON UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Microstructure; Reactive element effect; Structure of interfaces

Indexed keywords

ANNEALING; GRAIN GROWTH; INTERFACES (MATERIALS); MICROSTRUCTURE; PRECIPITATION (CHEMICAL); SAPPHIRE; SPUTTER DEPOSITION; THIN FILMS;

COLUMNAR GRAINS;

IRON COMPOUNDS;

STRENGTH ASSESSMENT;

EID: 0037654955     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(02)00792-X     Document Type: Article

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