Effect of substrate orientation, roughness, and film deposition mode on the tensile strength and toughness of niobium-sapphire interfaces

Journal of the American Ceramic Society

Volumn 80, Issue 12, 1997, Pages 3172-3180

  Gupta, Vijay ^a   Wu, Jianxin ^a   Pronin, Alexander N ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); NIOBIUM; SAPPHIRE; SPUTTER DEPOSITION; SUBSTRATES; SURFACE ROUGHNESS; TENSILE STRENGTH; TOUGHNESS;

INTERFACE ROUGHNESS; SUBSTRATE ORIENTATION;

METALLIC FILMS;

EID: 0031358198     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1997.tb03246.x     Document Type: Article

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