Thickness dependence of the magnetic hysteresis of NiFe-31% films as a function of an applied isotropic in-plane stress

Journal of Applied Physics

Volumn 93, Issue 10 3, 2003, Pages 8624-8626

  Garrett, Claude ^a   Holland, Patrick ^a   Geerts, Wilhelmus J ^a   Ragan, Dustin ^b   Dubey, Archana ^c   Rios, Steve ^a   Bandyopadhyay, Anup K ^a  

^a TEXAS STATE UNIVERSITY   (United States)

^b TRINITY UNIVERSITY   (United States)

^c UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; KERR MAGNETOOPTICAL EFFECT; MAGNETIC HYSTERESIS; MAGNETOMETERS; MAGNETRON SPUTTERING; NICKEL COMPOUNDS; STRAIN; STRESS ANALYSIS;

KERR MAGNETOMETERS;

MAGNETIC FILMS;

EID: 0037640039     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1558242     Document Type: Conference Paper

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