New observance and analysis of various guard-ring structures on latch-up hardness by backside photo emission image

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2003, Pages 92-98

  Liao, Scott ^a   Niou, Chorng ^a   Chien, Kary ^a   Guo, Annie ^a   Dong, Walden ^a   Huang, Charles ^a  

^a Semiconduct Mfg Intl Company   (China)

Author keywords

Latch Up; Photon emission microscope

Indexed keywords

CMOS INTEGRATED CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; IMAGE ANALYSIS; PHOTOEMISSION;

PHOTO EMISSION MICROSCOPES;

FLIP FLOP CIRCUITS;

EID: 0037634701     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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