Ultralow-noise near-infrared detection system with a Si p-i-n photodiode

Optics Letters

Volumn 28, Issue 12, 2003, Pages 1010-1012

  Akiba, Makoto ^a   Fujiwara, Mikio ^a  

^a NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; INFRARED RADIATION; PHOTODETECTORS; SILICON; SPURIOUS SIGNAL NOISE;

NEAR-INFRARED DETECTION SYSTEMS;

PHOTODIODES;

EID: 0037634000     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.28.001010     Document Type: Article

References (14)

1. S. Hallensleben, S. W. Harmer, and P. D. Townsend, J. Phys. D 32, 623 (1999).
2. J. J. Fox, N. Woodard, and G. P. Lafyatis, Rev. Sci. Instrum. 70, 1951 (1999).
3. S. Bondurant, P. Kumar, J. H. Shapiro, and M. M. Salour, Opt. Lett. 7, 529 (1982).
4. J. Kim, S. Takeuchi, Y. Yamamoto, and H. H. Hogue, Appl. Phys. Lett. 74, 902 (1999).
5. S. Takeuchi, J. Kim, Y. Yamamoto, and H. H. Hogue, Appl. Phys. Lett. 74, 1063 (1999).
6. K. Kandiah, IEEE Trans. Electron Devices 41, 2006 (1994).
7. M. Akiba, Appl. Phys. Lett. 71, 3236 (1997).
8. M. Akiba, Jpn. J. Appl. Phys. 38, L 558 (1999).
9. M. Akiba, Proc. SPIE 4130, 850 (2000).
10. H. Bouchiat and M. Ocio, Comments Condens. Matter Phys. 14, 163 (1988).
11. N. E. Israeloff, Phys. Rev. B 53, R11 913 (1996).
12. A. K. Jonscher, Nature 267, 673 (1977).
13. W. K. Lee, J. F. Liu, and A. S. Nowick, Phys. Rev. Lett. 67, 1559 (1991).
14. B. S. Lim, A. V. Vaysleyb, and A. S. Nowick, Appl. Phys. A 56, 8 (1993).