Dielectric polarization noise in low-noise Si junction field-effect transistors at 77 K

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 38, Issue 5 B, 1999, Pages

  Akiba, Makoto ^a  

^a NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; ELECTRODES; POLARIZATION; SEMICONDUCTING SILICON; SPURIOUS SIGNAL NOISE;

DIELECTRIC POLARIZATION NOISE;

JUNCTION GATE FIELD EFFECT TRANSISTORS;

EID: 0032664548     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.l558     Document Type: Article

References (14)