Absolute metrology for the Kite testbed

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4852, Issue 1, 2002, Pages 336-346

  Mason, James E ^a  

^a LOCKHEED MARTIN   (United States)

Author keywords

Absolute metrology; Switched heterodyne metrology

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; GAGES; HETERODYNING; INSTRUMENT TESTING; INTERFEROMETRY; OPTICAL VARIABLES MEASUREMENT; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE;

ABSOLUTE METROLOGY; KITE TESTBED; PICOMETERS; SWITCHED HETERODYNE METROLOGY;

INTERFEROMETERS;

EID: 0037612568     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.460941     Document Type: Conference Paper

References (7)

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4. P. Halverson and R. Spero, "Signal processing and testing of displacement metrology gauges with picometer-scale cyclic non-linearity," submitted to Journal of Optics A, 2002.
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7. The Infrared and Electro-Optical Systems Handbook, vol. 2, SPIE Press, 1993.