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Volumn 434, Issue 1-2, 2003, Pages 157-161

Determination of the electron temperature profile above the evaporative source in an ion plating discharge by spatially resolved optical emission spectroscopy

Author keywords

Electron temperature; Evaporative source; Optical emission spectroscopy

Indexed keywords

ELECTRONS; EMISSION SPECTROSCOPY; EVAPORATION; THERMAL EFFECTS;

EID: 0037601701     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00140-8     Document Type: Article
Times cited : (1)

References (13)
  • 4
    • 0004189682 scopus 로고
    • R.H. Huddlestone, & S.L. Leonard. New York: Academic Press
    • McWhirter R.W.P. Huddlestone R.H., Leonard S.L. Plasma Diagnostic Techniques. 1965;Academic Press, New York.
    • (1965) Plasma Diagnostic Techniques
    • McWhirter, R.W.P.1
  • 9
    • 0004056077 scopus 로고
    • New York, San Francisco: McGraw-Hill
    • Griem H.R. Plasma Spectroscopy. 1964;McGraw-Hill, New York, San Francisco.
    • (1964) Plasma Spectroscopy
    • Griem, H.R.1
  • 10
    • 0020723591 scopus 로고
    • Hurley R.E. Vacuum. 34:1984;351-355.
    • (1984) Vacuum , vol.34 , pp. 351-355
    • Hurley, R.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.