Inelastic electron analysis in reflection high-energy electron diffraction condition

Applied Surface Science

Volumn 212-213, Issue SPEC., 2003, Pages 157-161

  Nakahara, H ^a   Hishida, T ^a   Ichimiya, A ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Electron energy loss spectroscopy (EELS); Plasmons; Reflection high energy electron diffraction (RHEED); Silicon; Surface waves

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SILICON; SURFACE WAVES;

PLASMONS;

ELECTRON ENERGY LEVELS;

EID: 0037566128     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00057-6     Document Type: Conference Paper

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