Thermal detection of trapped charge carriers in organic transport materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4800, Issue , 2002, Pages 164-171

  Von Malm, Norwin ^a   Steiger, Juergen ^b   Finnberg, Torsten ^a   Schmechel, Roland ^a   Von Seggern, Heinz ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b COVION Organic Semiconductors ^*  (Germany)

Author keywords

Dopant; Electroluminescence; OLED; Organic light emitting diodes; Pulsed electroluminescence; Thermally stimulated currents; Trap; TSC

Indexed keywords

CURRENT DENSITY; ELECTRON ENERGY LEVELS; ELECTRON TRANSPORT PROPERTIES; ELECTRON TRAPS; LUMINESCENCE; OPTICAL VARIABLES MEASUREMENT; ORGANIC COMPOUNDS; SEMICONDUCTOR DOPING; SEMICONDUCTOR MATERIALS; THERMAL CONDUCTIVITY;

DOPANT; ORGANIC TRANSPORT MATERIALS; PULSED ELECTROLUMINESCENCE; THERMAL DETECTION; THERMALLY STIMULATED CURRENTS; TRAP LEVEL DETECTION ENERGY;

CHARGE CARRIERS;

EID: 0037516661     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.451903     Document Type: Conference Paper

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