Wide field imaging interferometry testbed III - Metrology subsystem

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4852, Issue 2, 2002, Pages 827-838

  Leviton, Douglas B ^a   Frey, Bradley J ^a   Leisawitz, David T ^a   Martino, Anthony J ^a   Maynard, William L ^a   Mundy, Lee G ^b   Rinehart, Stephen A ^c   Teng, Stacy H ^b   Zhang, Xiaolei ^c  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b Bldg 142   (United States)

^c NONE

Author keywords

Absolute encoder; Alignment; Delay line; Interferometer; Metrology; Servo; Testbed; Wide field imaging

Indexed keywords

ENVIRONMENTAL IMPACT; IMAGE SENSORS; IMAGING SYSTEMS; INTERFEROMETERS; MONITORING; PERTURBATION TECHNIQUES; POSITION CONTROL; POSITION MEASUREMENT; SIGNAL RECEIVERS; TEMPERATURE MEASUREMENT;

DISPLACEMENT MEASURING INTERFEROMETERS; OPTICAL ALIGNMENT TOOLS; OPTICAL ENCODERS; OPTICAL POWER MONITORS; TEMPERATURE SENSORS; WIDE FIELD IMAGING INTERFEROMETRY;

INTERFEROMETRY;

EID: 0037502863     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.460948     Document Type: Conference Paper

References (9)

1. D. Leisawitz, et al., "Wide Field Imaging Interferometry," NASA proposal NRA-99-01-SPA-020
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5. D.B. Leviton, "Absolute position encoders using pattern recognition," NASA Tech Briefs, 24 (6), p.6a, 2000
6. D.B. Leviton, "Image processing for new optical pattern recognition encoders," SPIE 4113, p. 32, July 2000
7. D.B. Leviton, M.S. Garza "Recent advances and applications for NASA's new, ultra-high sensitivity, absolute, optical pattern recognition encoders," SPIE 4091, p. 385, July 2000
8. S.A. Rinehart, et al., "Wide Field Imaging Interferometry Testbed III - performance and plans," SPIE 4852-45. Waikoloa, August 2002
9. D.B. Leviton, B.J. Frey, "Ultra-high resolution, absolute position sensors for cryostatic applications," SPIE 4850-111, Waikoloa, August 2002