Wide-field imaging interferometry testbed II: Implementation, performance, and plans

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4852, Issue 2, 2002, Pages 674-684

  Rinehart, S A ^a   Frey, Bradley J ^a   Leisawitz, David T ^a   Leviton, Douglas B ^a   Martino, Anthony J ^a   Maynard, William L ^a   Mundy, Lee G ^a,b   Teng, Stacy H ^b   Zhang, Xiaolei ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

Interferometry; Michelson interferometer; Synthesis imaging; Testbed; Wide field imaging

Indexed keywords

ALGORITHMS; DATA REDUCTION; DIFFRACTION GRATINGS; ERROR ANALYSIS; ESTIMATION; IMAGING SYSTEMS; INTERFEROMETERS; LIGHT SOURCES; OPTICAL PROPERTIES; TEMPERATURE MEASURING INSTRUMENTS;

MICHELSON INTERFEROMETER; OPTICAL WAVELENGTHS; POWER DETECTOR; TEMPERATURE SENSOR; WIDE FIELD IMAGING INTERFEROMETRY TESTBED;

INTERFEROMETRY;

EID: 0037950537     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.460705     Document Type: Conference Paper

References (2)

1. D. T. Leisawitz, et al., "Wide Field Imaging Interferometry Testbed I - Purpose, Design and Data Products", SPIE 4852-34, Waikoloa, August 2002.
2. D. B. Leviton, et al., "Wide Field Imaging Interferometry Testbed III - Metrology Subsystem", SPIE 4852-99, Waikoloa, August 2002.