Dynamic error correction of a digitizer for time domain metrology

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2003, Pages 748-753

  Bergman, David I ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; APPLICATION SPECIFIC INTEGRATED CIRCUITS; ERROR CORRECTION; HARMONIC DISTORTION; LINEAR SYSTEMS; HARMONIC ANALYSIS; INTEGRATED CIRCUITS; MEASUREMENTS; NUMERICAL METHODS; PROBES; TIME DOMAIN ANALYSIS; UNITS OF MEASUREMENT;

DIGITIZERS;

DIGITAL INSTRUMENTS; ERRORS;

FREQUENCY; INTEGRATED CIRCUIT MEASUREMENTS; NIST; PHASE DISTORTIONS; SAMPLING METHOD;

EID: 0037493623     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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