A low noise latching comparator probe for waveform sampling applications

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2002, Pages 309-314

  Bergman, David I ^a   Waltrip, Bryan C ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Comparator; Frequency compensation; Signal sampling; Successive approximation; Voltage measurement

Indexed keywords

ALGORITHMS; ANALOG TO DIGITAL CONVERSION; APPROXIMATION THEORY; COMPARATOR CIRCUITS; ELECTRIC ATTENUATORS; ELECTRIC IMPEDANCE; HARMONIC DISTORTION; SAMPLING; VOLTAGE MEASUREMENT;

DIGITAL FILTERING ALGORITHM; FREQUENCY COMPENSATION; LATCHING COMPARATOR PROBE;

PROBES;

EID: 0036053004     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

1. A wideband sampling voltmeter
2. A custom integrated circuit comparator for high-performance sampling applications
3. Calibration services users guide
4. Optimization of a latched comparator for high-speed analog-to-digital converters
5. An 8-bit 200-MHz BiCMOS comparator
6. A sensitive analog comparator
7. Standard for digitizing waveform recorders
8. Standard for terminology and test methods for analog-to-digital converters
9. Accurate frequency response determinations from discrete step response data
10. Bounds on frequency response estimates derived from uncertain step response data