Electrical characterization of the large amount of silicon sensors for alpha magnetic spectrometer (AMS) tracker

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 2003, Pages 786-791

  Dinu, Nicoleta ^a   Fiandrini, Emanuele ^a  

^a INFN SEZIONE DI PERUGIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; LEAKAGE CURRENTS; PARTICLE ACCELERATORS; SPACE STATIONS; ASSEMBLY; CHARACTERIZATION; ELECTRONIC EQUIPMENT; ELECTRONIC EQUIPMENT TESTING; EQUIPMENT TESTING; MAGNETIC SENSORS; OSCILLATORS (ELECTRONIC); SILICON; SPECTROSCOPY;

ELECTRICAL CHARACTERIZATION;

SILICON SENSORS; SPECTROMETERS;

ALPHA MAGNETIC SPECTROMETERS; ELECTRICAL CHARACTERIZATION; ELECTRICAL RESISTANCE MEASUREMENT; INTERNATIONAL SPACE STATIONS; PARTICLE TRACKING; READOUT ELECTRONICS; SILICON MICRO-STRIP; STRIPS;

EID: 0037493595     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. B. Alpat et al., "High-precision tracking and charge selection with silicon strip detectors for relativistic ions", Nucl.Instr. & Meth. A, Vol. 446, No.3, pp. 522-535, 2000.
2. WB. Atwood, GLAST Collaboration, "Gamma large area silicon telescope (GLAST): applying silicon strip detector technology to the detection of gamma rays in space", Nucl. Instr. & Meth. A, Vol. 342, pp. 302-307, 1994
3. CMS Tracker Project, Technical Design Report CMS TDR 5 CERN/LHCC 8-6, 15 April 1998
4. C.R. Newsom, "Overview of the BT eV pixel detector", Nucl. Instr. & Meth. A, Vol. 465, No.1, pp. 34-39, June 2001
5. R. Battiston, "The Alpha Magnetic Spectrometer (AMS): search for the antimatter and dark matter on the International Space Station". Nucl. Instr. & Meth. A, Vol.409, No. 1/3, pp. 458-463, May 1998.
6. J. Ellison et al., "Punch-through currents and floating strips potentials in silicon detectors", IEEE Trans. Nucl. Sci., Vol. 36, No.1, pp. 267, 1989.
7. G. Lutz, "Semiconductor Radiation Detectors - Device Physics", Springer 1999, ISBN 3-540-64859-3.