High-precision tracking and charge selection with silicon strip detectors for relativistic ions

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 446, Issue 3, 2000, Pages 522-535

  Alpat, B ^a   Ambrosi, G ^b   Balboni, C ^b   Battiston, R ^a   Biland, A ^c   Bourquin, M ^b   Burger, W J ^b   Chang, Y H ^d   Chen, A E ^d   Dinu, N ^a,b   Extermann, P ^b   Fiandrini, E ^a   Hou, S R ^d   Ionica, M ^a   Ionica, R ^a,b   Lin, W T ^d   Lustermann, W ^c   Maehlum, G ^a   Menichelli, M ^a   Pauluzzi, M ^a   Produit, N ^b   Rapin, D ^b   Ren, D ^c   Ribordy, M ^b   Sann, H ^e   Schardt, D ^e   Summerer K ^e   Viertel, G ^c   Vite D ^b   Wallraff, W ^f   Wu, S X ^d   more..

^a INFN SEZIONE DI PERUGIA   (Italy)

^b UNIVERSITY OF GENEVA   (Switzerland)

^c ETH ZURICH   (Switzerland)

^d NATIONAL CENTRAL UNIVERSITY   (Taiwan)

^e GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^f RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLE SPECTROMETERS; APPROXIMATION THEORY; CARBON; COMPUTATIONAL METHODS; ION BEAMS; PARTICLE BEAM TRACKING; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES;

ALPHA MAGNETIC SPECTROMETERS (AMS); GAUSSIAN APPROXIMATION; LANDAU-VAVILOV THEORY; MOLIERE THEORY; MULTIPLE COULOMB SCATTERING; SEMICONDUCTOR DETECTORS; STRIP DETECTORS;

IONIZATION CHAMBERS;

EID: 0033749296     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)01184-5     Document Type: Article

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