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Volumn 1, Issue , 2003, Pages 865-870

Microwave broadband free-space complex dielectric permittivity measurements on low loss solids

Author keywords

[No Author keywords available]

Indexed keywords

BOROSILICATE GLASS; ELECTRIC NETWORK ANALYZERS; ERROR CORRECTION; FOCUSING; LENSES; MICROWAVES; NETWORK PROTOCOLS; POLYPROPYLENES; WAVE TRANSMISSION; ACETAL RESINS; ANTENNAS; COMPLEX NETWORKS; COMPUTER PROGRAMMING LANGUAGES; DIELECTRIC DEVICES; DIELECTRIC LOSSES; HORN ANTENNAS; MICROWAVE MEASUREMENT; PERMITTIVITY MEASUREMENT; SOLIDS;

EID: 0037493529     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (17)

References (13)
  • 1
    • 0035919962 scopus 로고    scopus 로고
    • Wideband and noncontact characterization of the complex permittivity of liquids
    • July 20
    • K. A. Jose, V. K. Varadan, and V.V. Varadan, "Wideband and Noncontact Characterization of the Complex Permittivity of Liquids," Microwave and Optical Technology Letters, Vol. 30, No. 2, pp. 75-79, July 20 2001.
    • (2001) Microwave and Optical Technology Letters , vol.30 , Issue.2 , pp. 75-79
    • Jose, K.A.1    Varadan, V.K.2    Varadan, V.V.3
  • 2
    • 0024681561 scopus 로고
    • A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies
    • June
    • Deepak K. Ghodgaonkar, Vasundara V. Varadan, and Vijay K. Varadan, "A Free-Space Method for Measurement of Dielectric Constants and Loss Tangents at Microwave Frequencies," IEEE Transactions on Instrumentation and Measurement, Vol. 37, No. 3, pp. 789-793, June 1989.
    • (1989) IEEE Transactions on Instrumentation and Measurement , vol.37 , Issue.3 , pp. 789-793
    • Ghodgaonkar, D.K.1    Varadan, V.V.2    Varadan, V.K.3
  • 3
    • 0025414694 scopus 로고
    • Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies
    • April
    • D. K. Ghodgaonkar, V. V. Varadan, and V. K. Varadan, "Free-Space Measurement of Complex Permittivity and Complex Permeability of Magnetic Materials at Microwave Frequencies," IEEE Transactions on Instrumentation and Measurement, Vol. 39, No 2, pp. 387-394, April 1990.
    • (1990) IEEE Transactions on Instrumentation and Measurement , vol.39 , Issue.2 , pp. 387-394
    • Ghodgaonkar, D.K.1    Varadan, V.V.2    Varadan, V.K.3
  • 6
    • 0037635913 scopus 로고
    • Measuring dielectric constants with the HP8510 network analyzer
    • Aug.
    • Hewlett-Packard Product Note 8510-3, Measuring dielectric constants with the HP8510 network analyzer, 5954-1535, Aug. 1985.
    • (1985) Hewlett-Packard Product Note , vol.8510 , Issue.3 , pp. 5954-1535
  • 8
    • 84891258104 scopus 로고
    • Precision millimeter wave measurements of complex refractive index, complex dielectric permittivity and loss tangent of common polymers
    • June
    • Mohammed N. Afsar, "Precision millimeter wave measurements of complex refractive index, complex dielectric permittivity and loss tangent of common polymers," IEEE Transactions on Instrumentation & Measurement, Vol. IM-36, pp. 554-561, June 1977.
    • (1977) IEEE Transactions on Instrumentation & Measurement , vol.IM-36 , pp. 554-561
    • Afsar, M.N.1
  • 10
    • 0035308762 scopus 로고    scopus 로고
    • A novel open-resonator system for precise measurement of permittivity and loss-tangent
    • April
    • Mohammed N. Afsar, and Hanyi Ding, "A Novel Open-Resonator System for Precise Measurement of Permittivity and Loss-tangent," IEEE Transactions on Instrumentation & Measurement, Vol. 50, No. 2, pp 402-405, April 2001.
    • (2001) IEEE Transactions on Instrumentation & Measurement , vol.50 , Issue.2 , pp. 402-405
    • Afsar, M.N.1    Ding, H.2
  • 13
    • 0038311543 scopus 로고    scopus 로고
    • McMaster-Carr Supply Company, Catalog 108, 2002
    • McMaster-Carr Supply Company, Catalog 108, 2002.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.