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Volumn 103, Issue , 2002, Pages 25-28

Characterisation and formation of a-C: D layers below the divertor of ASDEX Upgrade

Author keywords

[No Author keywords available]

Indexed keywords

DEUTERIUM; ELLIPSOMETRY; HYDROCARBONS; PLASMA COLLISION PROCESSES; PROBABILITY; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS;

EID: 0037481655     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (13)
  • 3
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    • 0036601275 scopus 로고    scopus 로고
    • Neu, R. et al., PPCF 44, 1021 (2002).
    • (2002) PPCF , vol.44 , pp. 1021
    • Neu, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.