Tablet surface characterisation by various imaging techniques

International Journal of Pharmaceutics

Volumn 254, Issue 2, 2003, Pages 281-286

  Seitavuopio, Paulus ^a   Rantanen, Jukka ^a   Yliruusi, Jouko ^a  

^a UNIVERSITY OF HELSINKI   (Finland)

Author keywords

Atomic force microscope (AFM); Laser profilometer; Scanning electron microscopy (SEM); Surface roughness; Tablet

Indexed keywords

POTASSIUM CHLORIDE; SODIUM CHLORIDE;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGING; LASER PROFILOMETRY; MICROSCOPY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; TABLET SURFACE;

EID: 0037467159     PISSN: 03785173     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-5173(03)00026-7     Document Type: Article

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