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Volumn 351, Issue 1-2, 2003, Pages 166-173

Fracture of polycrystalline silicon

Author keywords

Fractography; Fracture toughness; Grain size; Silicon

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRACK PROPAGATION; DUCTILE FRACTURE; FRACTURE TOUGHNESS; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; STRESS INTENSITY FACTORS;

EID: 0037466820     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(02)00829-8     Document Type: Article
Times cited : (19)

References (35)
  • 29
    • 0003822721 scopus 로고
    • Electrochemical Society, Pennington, NJ
    • McCormick, J. R. (1986). Semiconductor Silicon. 43. Pennington, NJ: Electrochemical Society.
    • (1986) Semiconductor Silicon , pp. 43
    • McCormick, J.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.