Microstructural study of BaTiO3/SrTiO3 superlattice

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 98, Issue 1, 2003, Pages 6-9

  Tong, F Q ^a   Yu, W X ^a   Liu, F ^a   Zuo, Y ^a   Ge, X ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

BaTiO3 SrTiO3 superlattice; Interface and surface; Microstructure; Rms roughness; Small angle X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; COMPUTER SIMULATION; FILM GROWTH; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

ROOT-MEAN-SQUARE (RMS) ROUGHNESS;

SUPERLATTICES;

EID: 0037465542     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00409-9     Document Type: Article

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