Measurement and modeling of end group concentration depth profiles for ω-fluorosilane polystyrene and its blends

Macromolecules

Volumn 36, Issue 8, 2003, Pages 2956-2966

  O'Rourke Muisener, Patricia A V ^a   Jalbert, Claire A ^a,c   Yuan, Caigen ^a,d   Baetzold, John ^a,e   Mason, Ralf ^a   Wong, Derek ^a   Kim, Young Jun ^a   Koberstein, Jeffrey T ^a,g   Gunesin, Binnur ^b,f  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

^c IMAK   (United States)

^d EAST CHINA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^e 3M COMPANY   (United States)

^f Dutoit/Gunesin CS   (Switzerland)

^g Department of Chemical Engineering ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; MOLECULAR WEIGHT; POLYMER BLENDS; SILANES; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE SEGREGATION;

POLYSTYRENES;

EID: 0037461379     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma021623v     Document Type: Article

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