Optical properties of Cd0.9Zn0.1Te studied by variable angle spectroscopic ellipsometry between 0.75 and 6.24 eV

Journal of Electronic Materials

Volumn 28, Issue 6, 1999, Pages 760-765

  H w, Yao ^a,b   Erickson, J C ^a,b   Barber, H B ^c   James, R B ^b   Hermon, H ^b  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; BAND STRUCTURE; DIELECTRIC PROPERTIES OF SOLIDS; ELLIPSOMETRY; MATHEMATICAL MODELS; OSCILLATORS (ELECTRONIC); SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS;

CADMIUM ZINC TELLURIDE; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE);

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0345580742     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-999-0067-1     Document Type: Article

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