Second layer nucleation on Ge(0 0 1)

Surface Science

Volumn 526, Issue 1-2, 2003, Pages

  Li, M ^a   Altman, E I ^a  

^a Yale University   (United States)

Author keywords

Diffusion and migration; Germanium; Nucleation; Scanning tunneling microscopy

Indexed keywords

CRYSTAL GROWTH; DIFFUSION; DIMERS; NUCLEATION; SCANNING TUNNELING MICROSCOPY;

SECOND LAYER NUCLEATION;

SEMICONDUCTING GERMANIUM;

EID: 0037456109     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02653-5     Document Type: Article

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