The identification of soft X-ray lines

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 58, Issue 4, 2003, Pages 711-716

  Aßmann, Andrea ^a   Wendt, Michael ^a  

^a LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

Author keywords

Electron probe microanalysis; Line overlaps; Relative line intensities; Soft X ray spectra

Indexed keywords

APPROXIMATION THEORY; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; IRRADIATION; MICROANALYSIS; X RAY SPECTROSCOPY;

ELECTRON PROBE MICROANALYSIS;

X RAYS;

EID: 0037453507     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(02)00274-4     Document Type: Conference Paper

References (10)

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10. Wendt M. M spectra of elements 39≤Z≤56 measured with an ultra-thin window Si(Li) detector. Mikrochim. Acta. 139:2002;195-200.