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Volumn 77, Issue 2, 2003, Pages 145-153

GaAs/Ge solar cell AC parameters at different temperatures

Author keywords

AC parameters; GaAs Ge solar cell; Temperature

Indexed keywords

CAPACITANCE; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ENERGY GAP; PARAMETER ESTIMATION; PERMITTIVITY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GERMANIUM; THERMAL EFFECTS;

EID: 0037448133     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(02)00316-1     Document Type: Article
Times cited : (19)

References (8)
  • 1
    • 0035445387 scopus 로고    scopus 로고
    • Measurement of AC parameters of Gallium Arsenide (GaAs/Ge) solar cell by impedance spectroscopy
    • Anil Kumar R., Suresh M.S., Nagaraju J. Measurement of AC parameters of Gallium Arsenide (GaAs/Ge) solar cell by impedance spectroscopy. IEEE Trans. Electron Dev. 48(9):2001;2177-2179.
    • (2001) IEEE Trans. Electron Dev. , vol.48 , Issue.9 , pp. 2177-2179
    • Anil Kumar, R.1    Suresh, M.S.2    Nagaraju, J.3
  • 4
    • 0035420246 scopus 로고    scopus 로고
    • Facility to measure solar cell AC parameters using an impedance spectroscopy technique
    • Anil Kumar R., Suresh M.S., Nagaraju J. Facility to measure solar cell AC parameters using an impedance spectroscopy technique. Rev. Sci. Instrum. 72(8):2001;3422-3426.
    • (2001) Rev. Sci. Instrum. , vol.72 , Issue.8 , pp. 3422-3426
    • Anil Kumar, R.1    Suresh, M.S.2    Nagaraju, J.3
  • 6
    • 0013374871 scopus 로고    scopus 로고
    • Measurement and comparison silicon (BSR and BSFR) and Gallium Arsenide (GaAs/Ge) solar cell AC parameters
    • Anil Kumar R., Suresh M.S., Nagaraju J. Measurement and comparison silicon (BSR and BSFR) and Gallium Arsenide (GaAs/Ge) solar cell AC parameters. Sol. Energy Mater. Sol. cells. 60:2000;155-165.
    • (2000) Sol. Energy Mater. Sol. Cells , vol.60 , pp. 155-165
    • Anil Kumar, R.1    Suresh, M.S.2    Nagaraju, J.3
  • 7
    • 0004146424 scopus 로고    scopus 로고
    • Prentice-Hall, Englewood Cliff, NJ
    • K. Kano, Semiconductor Devices, Prentice-Hall, Englewood Cliff, NJ, 1998, pp. 61-63.
    • (1998) Semiconductor Devices , pp. 61-63
    • Kano, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.