Nano-crystallization and magnetic properties in the highly resistive Fe-Si-Zr-O films prepared by EB-PVD

Materials Science and Engineering: A

Volumn 344, Issue 1-2, 2003, Pages 74-78

  Bi, Xiaofang ^a   Ou, S Shengquan ^a   Gong, Shengkai ^a   Xu, Huibin ^a  

^a BEIHANG UNIVERSITY   (China)

Author keywords

EB PVD; Electrical resistivity; Magnetic properties; Nano crystallization

Indexed keywords

ANNEALING; COERCIVE FORCE; ELECTRIC CONDUCTIVITY; ELECTRON BEAMS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; IRON; MAGNETIZATION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PHYSICAL VAPOR DEPOSITION; RECRYSTALLIZATION (METALLURGY); STRUCTURAL ANALYSIS;

ULTRAFINE STRUCTURES;

MAGNETIC THIN FILMS;

FILM;

EID: 0037444142     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(02)00443-4     Document Type: Article

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