Soft magnetic properties of as-sputtered Fe-Al-O films

Journal of Magnetism and Magnetic Materials

Volumn 215, Issue , 2000, Pages 365-367

  Kim, S R ^a   Kim, K H ^b   Jang, Y I ^c   Kim, J ^c   Han, S H ^a   Kim, H J ^a  

^a Korea Institute of Science and Technology   (South Korea)

^b Myong Ji University   (South Korea)

^c Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; IRON COMPOUNDS; MAGNETIC PERMEABILITY; MAGNETIZATION; MAGNETRON SPUTTERING; MICROANALYSIS; NANOSTRUCTURED MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STRUCTURE (COMPOSITION); X RAY DIFFRACTION ANALYSIS;

IRON ALUMINUM OXIDES; SOFT MAGNETIC PROPERTIES; SPUTTERING INPUT POWER; STRUCTURAL PROPERTIES;

MAGNETIC THIN FILMS;

EID: 0033723994     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(00)00160-8     Document Type: Article

References (6)

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