Structural and optical properties of ZnSe films deposited on crystalline Al 2 O 3 substrate by laser ablation technique

Applied Surface Science

Volumn 208-209, Issue 1, 2003, Pages 582-588

  Perna, G ^a,b   Capozzi, V ^a,b   Plantamura, M C ^b   Minafra, A ^b   Biagi, P F ^b   Pallara, M ^b   Orlando, S ^c   Marotta, V ^c   Giardini, A ^c  

^a UNIVERSITY OF FOGGIA   (Italy)

^b UNIVERSITY OF BARI   (Italy)

^c CNR   (Italy)

Author keywords

Optical properties; Thin films; X ray scattering

Indexed keywords

ALUMINA; COMPRESSIVE STRESS; CRYSTALLINE MATERIALS; ENERGY GAP; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; SUBSTRATES; X RAY SCATTERING; ZINC COMPOUNDS; CRYSTAL STRUCTURE; FILM GROWTH;

LASER FLUENCE;

THIN FILMS;

EID: 0037443181     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01387-9     Document Type: Conference Paper

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