High energy ion irradiation induced surface roughening in Ag and Cu films

Applied Surface Science

Volumn 206, Issue 1-4, 2003, Pages 178-186

  Crespo Sosa, Alejandro ^a   Muñoz, Manuel ^a   Cheang Wong, Juan Carlos ^a   Oliver, Alicia ^a   Sániger, José M ^a   Bañuelos, José G ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

AFM; Ion beam effects; Surface roughening

Indexed keywords

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; COPPER; DEFECTS; FRACTALS; GRAIN BOUNDARIES; ION BEAMS; ION BOMBARDMENT; SILVER; SPUTTERING; THERMOANALYSIS;

THERMALLY ACTIVATED MECHANISMS;

SURFACE ROUGHNESS;

EID: 0037441186     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01213-8     Document Type: Article

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