SIMS depth profiling of working environment nanoparticles

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 757-761

  Konarski, P ^a   Iwanejko, I ^a   Mierzejewska, A ^a  

^a INSTITUTE OF VACUUM TECHNOLOGY   (Poland)

Author keywords

Core shell morphology; Depth profile analysis; Nanoparticles; Sample rotation SIMS; Secondary ion mass spectrometry (SIMS); Welding fume particles

Indexed keywords

CARBON STEEL; GAS METAL ARC WELDING; ION BEAMS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SECONDARY ION MASS SPECTROMETRY; STAINLESS STEEL; VACUUM APPLICATIONS;

SHIELDED METAL ARC WELDING (SMAW);

SURFACE PHENOMENA;

EID: 0037438083     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00881-4     Document Type: Conference Paper

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