Oxidation of Ni3(dpa)4Cl2 and Cu3(dpa)4Cl2: Nickel-nickel bonding interaction, but no copper-copper bonds

Inorganic Chemistry

Volumn 42, Issue 7, 2003, Pages 2418-2427

  Berry, John F ^a   Cotton, F Albert ^a   Daniels, Lee M ^a,b   Murillo, Carlos A ^a   Wang, Xiaoping ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

^b Rigaku/MSC Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORIDE; COPPER; DI(2 PYRIDYL)AMINE; NICKEL; PYRIDINE DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL BOND; CRYSTAL STRUCTURE; ELECTRICITY; OXIDATION;

EID: 0037425167     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic0262740     Document Type: Article

References (83)

1. Cotton, F. A.; Daniels, L. M.; Murillo, C. A.; Pascual, I. J. Am. Chem. Soc. 1997, 119, 10223.
2. (a) Cotton, F. A.; Daniels, L. M.; Jordan, G. T., IV; Murillo, C. A. J. Am. Chem. Soc. 1997, 119, 10377.
3. (b) Cotton, F. A.; Murillo, C. A.; Wang, X. J. Chem. Soc., Dalton Trans. 1999, 3327.
4. (c) Clérac, R.; Cotton, F. A.; Daniels, L. M.; Dunbar, K. R.; Kirschbaum, K.; Murillo, C. A.; Pinkerton, A. A.; Schultz, A. J.; Wang, X. J. Am. Chem. Soc. 2000, 122, 6226.
5. (d) Yang, E.-C.; Cheng, M.-C.; Tsai, M.-S.; Peng, S.-M. J. Chem. Soc., Chem. Commun. 1994, 2377.
6. (a) Clérac, R.; Cotton, F. A.; Dunbar, K. R.; Murillo, C. A.; Pascual, I.; Wang, X. Inorg. Chem. 1999, 38, 2655.
7. (b) Aduldecha, S.; Hathaway, B. J. Chem. Soc., Dalton Trans. 1991, 993.
8. (a) Berry, J. F.; Cotton, F. A.; Lei, P.; Murillo, C. A. Inorg. Chem. 2003, 42, 377.
9. (b) Pyrka, G. J.; El-Mekki, M.; Pinkerton, A. A. J. Chem. Soc., Chem. Commun. 1991, 84.
10. (c) Wu, L.-P.; Field, P.; Morrissey, T.; Murphy, C.; Nagle, P.; Hathaway, B.; Simmons, C.; Thornton, P. J. Chem. Soc., Dalton Trans. 1990, 3835.
11. Sheu, J.-T.; Lin, C.-C.; Chao, I.; Wang, C.-C.; Peng, S.-M. Chem. Commun. 1996, 315.
12. (a) Cotton, F. A.; Daniels, L. M.; Lu, T.; Murillo, C. A.; Wang, X. J. Chem. Soc., Dalton Trans. 1999, 517.
13. (b) Cotton, F. A.; Daniels, L. M.; Murillo, C. A.; Wang, X. Chem. Commun. 1999, 2461.
14. (a) Long-Guan, Z.; Peng, S.-M. Wuji Huaxue Xuebao (J. Inorg. Chem. (China)) 2002, 18, 117.
15. (b) Wang, C.-C.; Lo, W.-C.; Chao, C.-C.; Lee, G.-H.; Chen, J.-M.; Peng, S.-M. Inorg. Chem. 2001, 47, 4059.
16. (c) Lai, S.-Y.; Wang, C.-C.; Chen, Y.-H.; Lee, C.-C.; Liu, Y.-H.; Peng, S.-M. J. Chin. Chem. Soc. (Taipei) 1999, 46, 477.
17. (d) Peng, S.-M.; Wang, C.-C.: Jang, Y.-L.; Chen, Y.-H.; Li, F.-Y.; Mou, C.-Y.: Leung, M.-K. J. Magn. Magn. Mater. 2000, 209, 80.
18. (e) Yeh, C.-Y.: Chou, C.-H.; Pan, K.-C.; Wang, C.-C.; Lee, G.-H.; Su, Y. O.; Peng, S.-M. J. Chem. Soc., Dalton Trans. 2002, 2670.
19. (f) Yeh, C.-Y.; Chiang, Y.-L.; Lee, G.-H.; Peng, S.-M. Inorg. Chem. 2002, 41, 4096.
20. Berry, J. F.; Cotton, F. A.; Daniels, L. M.; Murillo, C. A. J. Am. Chem. Soc. 2002, 124, 3212.
21. Cotton, F. A.; Daniels, L. M.; Murillo, C. A.; Pascual, I. Inorg. Chem. Commun. 1998, 1, 1.
22. Clérac, R.; Cotton, F. A.; Daniels, L. M.; Dunbar, K. R.; Murillo, C. A.; Pascual, I. Inorg. Chem. 2000, 39, 752.
23. Clérac, R.; Cotton, F. A.; Dunbar, K. R.; Lu, T.; Murillo, C. A.; Wang, X. J. Am. Chem. Soc. 2000, 122, 2272.
24. (a) Rohmer, M.-M.; Bénard, M. J. Am. Chem. Soc. 1998, 120, 9372.
25. (b) Rohmer, M.-M.; Strich, A.; Bénard, M.; Malrieu, J.-P. J. Am. Chem. Soc. 2001, 123, 9126.
26. (c) Benbellat, N.; Rohmer, M.-M.: Bénard, M. Chem. Commun. 2001, 2368.
27. (d) Rohmer, M.-M.; Bénard, M. Chem. Soc. Rev. 2001, 30, 340.
28. Hurley, T. J.; Robinson, M. A. Inorg. Chem. 1968, 7, 33.
29. Pflugrath, J.; Messerschmitt, A. MADNES, Munich Area Detector (New EEC) System, Version EEC 11/1/89, with enhancements by Enraf-Nonius Corp., Delft, The Netherlands. A description of MADNES appears in the following: Messerschmitt, A.; Pflugrath, J. J. Appl. Crystallogr. 1987, 20, 306.
30. Pflugrath, J.; Messerschmitt, A. MADNES, Munich Area Detector (New EEC) System, Version EEC 11/1/89, with enhancements by Enraf-Nonius Corp., Delft, The Netherlands. A description of MADNES appears in the following: Messerschmitt, A.; Pflugrath, J. J. Appl. Crystallogr. 1987, 20, 306.
31. (a) Kabsch, W. J. Appl. Crystallogr. 1988, 21, 67.
32. (b) Kabsch, W. J. Appl. Crystallogr. 1988, 21, 916.
33. SORTAV. Program for absorption correction for Enraf-Nonius FAST diffractometer using the method of Blessing: Blessing, R. H. Acta Crystallogr. 1995, A51, 33.
34. SMART V5.05 Software for the CCD Detector System; Bruker Analytical X-Ray Systems, Inc.: Madison, WI, 1998.
35. SAINTPLUS. V5.00 Software for the CCD Detector System; Bruker Analytical X-Ray Systems, Inc.: Madison, WI. 1998.
36. SADABS. Program for absorption correction using SMART CCD based on the method of R. H. Blessing. See ref 16.
37. 3) peaks surrounding the molecule in physically meaningless positions.
38. CrystalClear: An Integrated Program for the Collection and Processing of Area Detector Data; Rigaku/MSC, Inc.: The Woodlands, TX, 1997-2002.
39. Refinement of only one component using HKLF 4 data was still unsatisfactory since all h = 0 reflections overlap exactly from both twin components.
40. SHELXTL, Version 5.03: Siemens Industrial Automation Inc.; Madison, WI, 1994.
41. Cotton, F. A.; Daniels, L. M.; Lei, P.; Murillo, C. A.; Wang, X. Inorg. Chem. 2001, 40, 2778.
42. Lai, S.-Y.; Lin, T.-W.: Chen, Y.-H.; Wang, C.-C.; Lee, G.-H.; Yang, M.-H.; Leung, M.-K.; Peng, S.-M. J. Am. Chem. Soc. 1999, 121, 250.
43. 3; space group P1; Z = 2. Berry, J. F.; Cotton, F. A.; Murillo, C. A. Unpublished results.
44. 3; space group Cc; Z = 4. Cr-Cr distances: 2.479(2), 2.052(2) Å. Berry, J. F.; Cotton, F. A.; Murillo, C. A. Unpublished results.
45. Berry, J. F.; Cotton, F. A.; Murillo, C. A. Unpublished results.
46. nb orbitals are approximately 70% metal based and ∼25% Cl based (see ref 12).
47. Clerac, R.: Cotton, F. A.; Daniels, L. M.; Dunbar, K. R.; Murillo, C. A.; Pascual, I. Inorg. Chem. 2000, 39, 748.
48. Peng, S.-M. Private communication.
49. Kato, M.; Muto, Y. Coord. Chem. Rev. 1988, 92, 45.
50. (a) Kilner, M.; Pietrzykowski, A. Polyhedron 1983, 2, 1379.
51. (b) Halfpenny, J. Acta Crystallogr. 1995, C51, 2542.
52. Clérac, R.; Cotton, F. A.; Daniels, L. M.; Gu, J.; Murillo, C. A.; Zhou, H.-C. Inorg. Chem. 2000, 39, 4488.
53. Kreutz, C. Prog. Inorg. Chem. 1983, 30, 1.
54. Cotton, F. A.; Wilkinson, G.; Murillo, C. A.; Bochmann, M. Advanced Inorganic Chemistry, 6th ed.; John Wiley & Sons, Inc.: New York, 1999.
55. (a) Solomon, E. I.; Sundaram, U. M.; Machonkin, T. E. Chem. Rev. 1996, 96, 2563.
56. (b) Siegbahn, E. M.; Wirstam, M. J. Am. Chem. Soc. 2001, 123, 11819.
57. (c) Solomon, E. I.; Chen, P.; Metz, M.; Lee, S.-K.; Palmer, A. E. Angew. Chem., Int. Ed. 2001, 40, 4570.
58. Bossu, F. P.; Margerum, D. W. Inorg. Chem. 1977, 16, 1210.
59. Bossu, F. P.; Chellappa, K. L.; Margerum, D. W. J. Am. Chem. Soc. 1977, 99, 2195.
60. (a) Levason, W.; Spicer, M. D. Coord. Chem. Rev. 1987, 76, 45.
61. (b) Sakurai, T.; Hongo, J.-I.; Nakahara, A. Inorg. Chim. Acta 1980, 46, 205.
62. Wondimagegn, T.; Ghosh, A. J. Am. Chem. Soc. 2001, 123, 1543.
63. (a) Guan, L. L.; Kuwahara, J.; Sugiura, Y. Biochemistry 1993, 32, 6141.
64. (b) Lampeka, Y. D.; Gavrish, S. P. Polyhedron 2000, 19, 2533.
65. (c) Freire, C.; de Castro, B. Polyhedron 1998, 17, 4227.
66. Grapperhaus, C. A.; Darensbourg, M. Y. Acc. Chem. Res. 1998, 31, 451.
67. (a) Ruiz, R.; Surville-Barland, C.; Aukauloo, A.; Anxolabehere-Mallart, E.; Journaux, Y.; Cano, J.; Muñoz, M. C. J. Chem. Soc., Dalton Trans. 1997, 745.
68. (b) Lamour, E.; Routier, S.; Bernier, J.-L.; Catteau, J.-P.; Bailly, C.; Vezin, H. J. Am. Chem. Soc. 1999, 121, 1862.
69. Ghosh, A.; Steene, E. J. Biol. Inorg. Chem. 2001, 6, 739.
70. (a) Shiren, K.; Ogo, S.; Fujinami, S.; Hayashi, H.; Suzuki, M.; Uehara, A.; Watanabe, Y.; Moro-oka, Y. J. Am. Chem. Soc. 2000, 122, 254.
71. (b) Mandimutsira, B. S.; Yamarik, J. L.; Brunold, T. C.; Gu, W.; Cramer, S. P.; Riordan, C. G. J. Am. Chem. Soc. 2001, 123, 9194.
72. (c) Hikichi, S.; Yoshizawa, M.; Sasakura, Y.; Akita, M.; Moro-oka, Y. J. Am. Chem. Soc. 1998, 120, 10567.
73. (a) Itoh, S.; Taki, M.; Nakao, H.; Holland, P. L.; Tolman, W. B.; Que, L., Jr.; Fukuzumi, S. Angew. Chem., Int. Ed. 2000, 39, 398.
74. (b) DuBois, J. L.; Mukherjee, P.; Stack, T. D. P.; Hedman, B.; Solomon, E. I.; Hodgson, K. O. J. Am. Chem. Soc. 2000, 122, 5775.
75. (c) Taki, M.; Teramae, S.; Nagatomo, S.; Tachi, Y.; Kitagawa, T.; Itoh, S.; Fukuzumi, S. J. Am. Chem. Soc. 2002, 124, 6367.
76. Bag, B.; Mondal, N.; Rosair, G.; Mitra, S. Chem. Commun., 2000, 1729.
77. Cotton, F. A.; Matusz, M.; Poli, R.; Feng, X. J. Am. Chem. Soc. 1988, 110, 1144.
78. (a) Root, D. E.; Henson, M. J.; Machonkin, T.; Mukherjee, P.; Stack, T. D. P.; Solomon, E. I. J. Am. Chem. Soc. 1998, 120, 4982.
79. (b) Daul, C.; Fernandez-Ceballos, S.; Ciofini, I.; Rauzy, C.; Schläpfer, C.-W. Chem. Eur. J. 2002, 8, 4392.
80. Fackler, J. P., Jr. Inorg. Chem. 2002, 41, 6959.
81. Murray, H. H.; Briggs, D. A.; Garzón, G.; Raptis, R.; Porter, L. C.; Fackler, J. P., Jr. Organometallics 1987, 6, 1992.
82. Wang, S.; Garzón, G.; King, C.; Wang, J.-C.; Fackler, J. P., Jr. Inorg. Chem. 1989, 28, 4623.
83. Clark, R. J. H. Chem. Soc. Rev. 1990, 19, 107.