Growth and optical properties of p-sexiphenyl thin films

Synthetic Metals

Volumn 137, Issue 1-3, 2003, Pages 961-962

  Blumstengel, S ^a,b   Meinardi, F ^a   Tubino, R ^a   Borghesi, A ^a  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b HUMBOLDT UNIVERSITY   (Germany)

Author keywords

Atomic; Force microscopy; p sexiphenyl; Polycrystalline thin films; UV VIS absorption

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE CARRIERS; ELECTRONIC STRUCTURE; FILM GROWTH; FUSED SILICA; MOLECULAR BEAMS; MORPHOLOGY; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS;

INTERMOLECULAR INTERACTIONS;

THIN FILMS;

EID: 0037419318     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(02)00949-9     Document Type: Conference Paper

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