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Volumn 39, Issue 2, 2003, Pages 165-177

Novel techniques for the optical characterization of photovoltaic materials and devices

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; NONDESTRUCTIVE EXAMINATION; OPTICAL COLLIMATORS; SPECTROPHOTOMETERS;

EID: 0037411960     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(01)00099-9     Document Type: Article
Times cited : (11)

References (20)
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    • Non-destructive optical characterization of photovoltaic modules by an integrating sphere. Part I: Mono-Si modules
    • Parretta A., Sarno A., Yakubu H. Non-destructive optical characterization of photovoltaic modules by an integrating sphere. Part I. mono-Si modules Opt Commun. 161:1999;297-309.
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    • Parretta, A.1    Sarno, A.2    Yakubu, H.3
  • 7
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    • Angle-dependent reflectance and transmittance measurements on photovoltaic materials and solar cells
    • Parretta A., Sarno A., Tortora P., Yakubu H., Maddalena P., Zhao J., Wang A. Angle-dependent reflectance and transmittance measurements on photovoltaic materials and solar cells. Opt Commun. 172:1999;139-151.
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  • 8
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    • Method for measurement of the directional/hemispherical reflectance of photovoltaic devices
    • Parretta A., Grillo P., Maddalena P., Tortora P. Method for measurement of the directional/hemispherical reflectance of photovoltaic devices. Opt Commun. 186:2000;1-14.
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  • 11
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    • Method for measurement of the hemispherical/hemispherical reflectance of photovoltaic devices
    • submitted for publication
    • Parretta A., Yakubu H., Ferrazza F. Method for measurement of the hemispherical/hemispherical reflectance of photovoltaic devices. Opt Commun, submitted for publication.
    • Opt Commun
    • Parretta, A.1    Yakubu, H.2    Ferrazza, F.3
  • 12
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  • 17
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.