Method for measurement of the directional/hemispherical reflectance of photovoltaic devices

Optics Communications

Volumn 186, Issue 1-3, 2000, Pages 1-14

  Parretta, A ^a   Grillo, P ^a   Maddalena, P ^b   Tortora, P ^b  

^a ENEA CR Portici   (Italy)

^b UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; PHOTOVOLTAIC CELLS; SOLAR CELLS;

DIRECTIONAL-HEMISPHERICAL REFLECTANCE;

OPTICAL COMMUNICATION;

EID: 0034501581     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(00)01039-7     Document Type: Article

References (9)

1. IEC Standards 891 and 1215, Bureau Central de la Commission Electrotechnique Internationale, Genève.
2. ASTM, Designation E 1175 - 87 (Reapproved 1996), Standard test method for determining solar or photopic reflectance, transmittance, and absorptance of materials using a large diameter integrating sphere.
3. A. Parretta, Patent It. A.N. RM 97 A 000676, 5 November 1997.
4. Parretta A., Sarno A., Yakubu H. Opt. Commun. 161:1999;297-309.
5. Parretta A., Sarno A., Tortora P., Yakubu H., Maddalena P., Zhao J., Wang A. Opt. Commun. 172:1999;139-151.
6. A. Parretta, A. Sarno, P. Tortora, Patent It. A.N. RM 99 A 000656, 25 October 1999.
7. G. Kortum, Reflectance spectroscopy, principles, methods, applications, Springer, Berlin, 1969, p. 28.
8. P. Maddalena, A. Parretta, P. Tortora, Opt. Commun., submitted for publication.
9. Zhao J., Wang A., Green M.A., Ferrazza F. Appl. Phys. Lett. 73:1998;1991-1993.