Substrate dependent properties of electrodeposited EuTe thin films

Journal of Physics and Chemistry of Solids

Volumn 64, Issue 5, 2003, Pages 723-730

  Gaikwad, N S ^a   Nikale, V M ^a   Bhosale, C H ^a  

^a SHIVAJI UNIVERSITY   (India)

Author keywords

A. Thin films; C. X ray diffraction; Elecrodeposition; Europium telluride; Scanning electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CURRENT DENSITY; ELECTRODEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; EUROPIUM COMPOUNDS; GLASS; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; STAINLESS STEEL; STOICHIOMETRY; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

POLARIZATION CURVES;

THIN FILMS;

EID: 0037406042     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(02)00206-8     Document Type: Article

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