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Volumn 36, Issue 15, 2001, Pages 2613-2626
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Structural characterization of electrodeposited EuSe thin films
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Author keywords
A. Chalcogenides; A. Thin films; C. Electron microscopy; C. X ray diffraction; D. Optical properties
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Indexed keywords
CATHODES;
ELECTRODEPOSITION;
ENERGY DISPERSIVE SPECTROSCOPY;
EUROPIUM COMPOUNDS;
POLYCRYSTALLINE MATERIALS;
SCANNING ELECTRON MICROSCOPY;
STAINLESS STEEL;
X RAY DIFFRACTION;
CHALCOGENIDES;
CODEPOSITION;
THIN FILMS;
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EID: 0035576420
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/S0025-5408(01)00756-5 Document Type: Article |
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Times cited : (5)
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References (31)
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