Study on tip-substrate interactions by STM and APFIM

Ultramicroscopy

Volumn 95, Issue SUPPL., 2003, Pages 189-197

  Fian, A ^a   Leisch, M ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Adhesion; Atom probe field ion microscopy; Scanning tunnelling microscopy; Tip surface interaction

Indexed keywords

COMPUTER SIMULATION; INDENTATION; SCANNING TUNNELING MICROSCOPY; SURFACE TESTING;

ATOM-PROBE (AP) FIELD ION MICROSCOPY (APFIM);

SURFACE PHENOMENA;

METAL;

ARTICLE; CALCULATION; CHEMICAL INTERACTION; COMPUTER SIMULATION; CRYSTAL STRUCTURE; DISSOCIATION; ELECTRON MICROSCOPY; MOLECULAR DYNAMICS; SCANNING TUNNELING MICROSCOPY;

EID: 0037402577     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00316-9     Document Type: Article

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