Active profiling and polishing for efficient control of material removal from large precision surfaces with moderate asphericity

Mechatronics

Volumn 13, Issue 4, 2003, Pages 295-312

  Kim, Sug Whan ^a,b,c   Walker, David ^b   Brooks, David ^b  

^a Yonsei University   (South Korea)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Active control; Aspheric surfaces; CNC grinding; Material removal; Polishing

Indexed keywords

FABRICATION; MIRRORS; OPTICAL TELESCOPES; POLISHING; PROFILOMETRY;

ACTIVE PROFILING;

MATERIALS HANDLING;

EID: 0037401496     PISSN: 09574158     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0957-4158(01)00088-5     Document Type: Article

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