An efficient method for calculating asymmetric diffraction peak profiles

Review of Scientific Instruments

Volumn 69, Issue 11, 1998, Pages 3837-3839

  Ida, Takashi ^a  

^a UNIVERSITY OF HYOGO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000364554     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149220     Document Type: Article

References (9)

1. C. J. Howard, J. Appl. Crystallogr. 15, 615 (1982).
2. F. Schreier, J. Quant. Spectrosc. Radiat. Transf. 48, 743 (1992).
3. G. K. Wertheim, M. A. Butler, K. W. West, and D. N. E. Buchanan, Rev. Sci. Instrum. 45, 1369 (1974).
4. P. Thompson, D. E. Cox, and J. B. Hastings, J. Appl. Crystallogr. 20, 79 (1987).
5. M. M. Hall, Jr., J. Appl. Crystallogr. 10, 66 (1977).
6. B. van Laar and W. B. Yelon, J. Appl. Crystallogr. 17, 47 (1984).
7. T. Ida, Rev. Sci. Instrum. 69, 2268 (1998).
8. L. W. Finger, D. E. Cox, and A. P. Jephcoat, J. Appl. Crystallogr. 27, 892 (1994).
9. W. H. Press, B. P. Flannery, S. A. Teukolsky, and W. T. Vetterling, Numerical Recipes (Cambridge University Press, Cambridge, 1986), Chap. 12.