Wavelet-PLS regression models for both exploratory data analysis and process monitoring

Journal of Chemometrics

Volumn 14, Issue 5-6, 2000, Pages 383-399

  Teppola, Pekka ^a,b   Minkkinen, Pentti ^a  

^a LAPPEENRANTA UNIVERSITY OF TECHNOLOGY   (Finland)

^b BASF SE   (Germany)

Author keywords

Activated sludge wastewater treatment plant; Chemometrics; Exploratory data analysis; Multiresolution analysis; Paper and pulp industry; Partial least squares; Process monitoring; Wavelets

Indexed keywords

ACTIVATED SLUDGE PROCESS; DATA HANDLING; INFORMATION ANALYSIS; LEAST SQUARES APPROXIMATIONS; MULTIRESOLUTION ANALYSIS; PAPER AND PULP INDUSTRY; PROCESS CONTROL; REGRESSION ANALYSIS; WASTEWATER TREATMENT;

ACTIVATED SLUDGE; ACTIVATED SLUDGE WASTEWATER TREATMENT PLANT; CHEMOMETRICES; EXPLORATORY DATA ANALYSIS; MULTI-RESOLUTION ANALYSIS; MULTIRESOLUTIONS ANALYSIS; PARTIAL LEAST SQUARES MODELS; PARTIAL LEAST-SQUARES; WASTE WATER TREATMENT PLANTS; WAVELET;

PROCESS MONITORING;

ANALYTIC METHOD; CHEMOMETRICS; CONFERENCE PAPER; DATA ANALYSIS; MEASUREMENT; REGRESSION ANALYSIS;

EID: 0033652903     PISSN: 08869383     EISSN: None     Source Type: Journal    
DOI: 10.1002/1099-128X(200009/12)14:5/6<383::AID-CEM616>3.0.CO;2-5     Document Type: Conference Paper

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