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Volumn 93, Issue 7, 2003, Pages 3784-3788

Electromagnetic enhancement effect in scanning tunneling microscope light emission from GaAs

Author keywords

[No Author keywords available]

Indexed keywords

FINITE DIFFERENCE METHOD; LIGHT EMISSION; LIGHT POLARIZATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; TIME DOMAIN ANALYSIS; TUNGSTEN;

EID: 0037391006     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1554473     Document Type: Article
Times cited : (2)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.