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Volumn 93, Issue 7, 2003, Pages 3784-3788
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Electromagnetic enhancement effect in scanning tunneling microscope light emission from GaAs
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Author keywords
[No Author keywords available]
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Indexed keywords
FINITE DIFFERENCE METHOD;
LIGHT EMISSION;
LIGHT POLARIZATION;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING GALLIUM ARSENIDE;
TIME DOMAIN ANALYSIS;
TUNGSTEN;
DIELECTRIC FUNCTIONS;
MAGNETOELECTRIC EFFECTS;
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EID: 0037391006
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1554473 Document Type: Article |
Times cited : (2)
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References (15)
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