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Applied Surface Science

Volumn 107, Issue , 1996, Pages 247-254

Nanometer-scale characterization of surface materials by STM light emission spectroscopy

(3) Uehara, Y a Ito, K a Ushioda, S a

a TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; EMISSION SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; SURFACE STRUCTURE;

LIGHT EMISSION SPECTROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 0030566289 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(96)00494-1 Document Type: Article

Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.