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Volumn 76, Issue 6, 2003, Pages 873-877

Determining the spin polarization of surfaces by spin-polarized scanning tunneling spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC CURRENTS; MAGNETIC STORAGE; MAGNETIZATION; POLARIZATION; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS; THIN FILMS;

EID: 0037390307     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-002-1967-6     Document Type: Conference Paper
Times cited : (19)

References (23)
  • 14
    • 0344712702 scopus 로고    scopus 로고
    • note
    • The reason is a negative lock-in signal at domain wall B, which is caused by a crosstalk of the modulation voltage to the tip-sample separation. This measurement artefact can be avoided by choosing a slower response time of the feedback circuit or higher modulation frequencies. The former, however, requires a reduced scanning speed and therefore leads to increased measurement times. Note that this complication is absent when full spectroscopy curves are measured and the feedback circuit is open


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.