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note
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The reason is a negative lock-in signal at domain wall B, which is caused by a crosstalk of the modulation voltage to the tip-sample separation. This measurement artefact can be avoided by choosing a slower response time of the feedback circuit or higher modulation frequencies. The former, however, requires a reduced scanning speed and therefore leads to increased measurement times. Note that this complication is absent when full spectroscopy curves are measured and the feedback circuit is open
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