Normal incidence refractometer

Optics Communications

Volumn 218, Issue 4-6, 2003, Pages 205-211

  Hsu, Cheng Chih ^a   Chen, Kun Huang ^a   Su, Der Chin ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT INTERFERENCE; LIGHT POLARIZATION; NUMERICAL ANALYSIS; OPTICAL SYSTEMS; REFRACTIVE INDEX;

CRITICAL ANGLE;

REFRACTOMETERS;

EID: 0037384528     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(03)01258-6     Document Type: Article

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