Accurate determination of the indices of refraction of nonlinear optical crystals

Applied Optics

Volumn 36, Issue 33, 1997, Pages 8587-8594

  Nicholls, John F H ^a,b   Henderson, Brian ^a   Chai, Bruce H T ^b  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; HELIUM NEON LASERS; INTERFEROMETRY; LASER BEAMS; MONOCHROMATORS; NUMERICAL METHODS; OPTICAL MATERIALS; OPTICAL VARIABLES MEASUREMENT; PRISMS; REFRACTIVE INDEX; SINGLE CRYSTALS; X RAY DIFFRACTION;

NONLINEAR OPTICAL CRYSTAL; POLARIZED MICHELSON INTERFEROMETRY;

NONLINEAR OPTICS;

EID: 0031269008     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.008587     Document Type: Article

References (11)

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